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透過向量網路分析儀 (VNA) 之相位同調,驗證雙極化相控陣列波束於 OTA 的性能
距離開課 - - -
我要報名研討會
課程代碼
VNA
課程時間
2026/3/12 (Thu.) 10:00-11:00 AM
主辦單位
台灣羅德史瓦茲
協辦單位
城市
地點
線上研討會不限地點
是否收費
報名人數
無上限
簡介

現代相控陣列需要在遠場環境下進行OTA測試。隨著陣列的之單元數量的增加、因為遠場距離的增加、Direct far-field設定中的 OTA 和線纜損耗也會隨之增加。未來的雙極化相控陣列將整合頻率轉換積體電路 (IC),因此需要進行 5 埠相位相關測量以進行校準(除非像 Fujikura PAAM — 相位陣列天線模組無需校準)和驗證。

本場線上研討會,將由 Rohde & Schwarz 和 Fujikura 的專家將共同探討未來相控陣列面對測試的挑戰。本次測試的設備為 Fujikura 高度整合的 FutureAccess™ 毫米波相控陣列天線模組(PAAM)。為了滿足嚴苛的量測要求,我們使用了R&S高階的向量網路分析儀 ZNA 以及緊湊型天線測試平台(CATR)—ATS800B 和 ATS800R 進行測試。

 

講者將與您深入探討:

  • 免校準相控陣的波束成形挑戰與設計特性
  • 建立遠場條件的權衡以及 CATR 的基礎知識
  • 帶頻率轉換器的相控陣列的五埠向量網路分析的挑戰
  • Fujikura PAAM 的性能,透過多項 OTA CATR 測試進行驗證:

◎ 相位相關網路分析儀(ZNA)功率掃描

◎ 輻射方向圖

◎ 功率和功率衰減的組合

◎ 獨立的相位和增益控制

◎ 溫度穩定性

◎ 波束切換

活動議程
時間活動議程活動講師下載
2026/03/12. THU. 透過向量網路分析儀 (VNA) 之相位同調,驗證雙極化相控陣列波束於 OTA 的性能
講師介紹
Fabrício Dourado
Fabrício Dourado / Senior Application Engineer, T&M Application Development, Rohde & Schwarz
Fabrício Dourado is a Senior Application Engineer at Rohde & Schwarz in Munich, Germany. Since joining R&S in 1996, he has held various roles in test and measurement product marketing and technical support across Europe, the Americas, and Asia. Initially specializing in mobile radio and production line remote control, Fabrício later focused on component testing up to 500GHz, multi-port network analysis, and base station testing. Since April 2020, he has concentrated on 5G, automotive radar, and over-the-air (OTA) testing as well as on OTA mmWave phased array testing in 5G NR FR2 and 4.8Gsps OTA linearization for carrier aggregation signals up to 800MHz bandwidth. Fabricio holds a degree in Electronics Engineering from the Instituto Tecnológico de Aeronáutica in São José dos Campos, Brazil.
Shinnosuke Tsuchiya
Shinnosuke Tsuchiya / Associate, Fujikura Ltd.
Shinnosuke Tsuchiya is an associate engineer at Fujikura Ltd. in Japan. He joined the company in 2017 and worked in high frequency material and mm-Wave module development division. His specialties were first high frequency materials and hybrid substrates for mm-Wave applications. Tsuchiya joined 5G wireless device development division in July 2021, focusing on over-the-air (OTA) testing and control software development. He holds a master’s degree in materials science from University of Tsukuba, Japan.
Thilo Bednorz
Thilo Bednorz / Senior Development Expert, Vector Network Analyzers, Rohde & Schwarz
Thilo Bednorz is a Senior Development Expert for Vector Network Analyzers at Rohde & Schwarz. He holds a master’s degree in electrical engineering from the Technical University of Munich. Thilo's career with R&S spans over 30 years, beginning as a design engineer in the Spectrum Analyzer group and then transitioning to the Vector Network Analyzer group, where he has since 1994 held various roles in product management and application engineering for high-end vector network analyzers. Thilo has developed various capabilities for VNAs, particularly in the areas of phase and group delay measurements on mixers, frequency converters, and satellites.
Yujiro Tojo, Ph.D.
Yujiro Tojo, Ph.D. / Assistant Manager, Fujikura Ltd.
Yujiro Tojo received the Bachelor and Master of Engineering degree in 2012 and 2014, respectively in Faculty of Science and Technology and the Doctor of Engineering degree above same department from in 2020 for research on superconductivity from Keio University, Japan. Since 2014, he has been with Fujikura Ltd. located in Chiba, Japan and has been working on R&D of superconductor, millimeter-wave passive components, the evaluation of a phased array antenna module for 5G with over-the-air (OTA) tests, and millimeter-wave business marketing research.