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Greg Bonaguide is a Senior Applications Engineer for Rohde & Schwarz, specializing in Spectrum Analyzer and Vector Network Analyzer technology. He has worked in the RF & Microwave field since 1982 in Design, Systems Engineering, and Test & Measurement roles. His experience includes stints with both Commercial and Aerospace/Defense companies such as the American Radio Relay League, Cubic Corporation, E-Systems, GTE Spacenet, Philips Semiconductors, and Raytheon. He holds Masters Degrees in both Electrical Engineering and Engineering Management from the University of South Florida, and has published in journals such as QST, the ARRL Handbook, Microwaves & RF, Test & Measurement World, and Evaluation Engineering. He has also authored and delivered several MicroApps presentations at past IEEE-MTT shows. He served on the 2016 EDI CON Technical Advisory Committee, was co-chairman for the 2014 International Microwave Symposium (IMS) Microwave Application Seminars (MicroApps), and served as Chairman of the IEEE Florida West Coast Section MTT/AP/ED Societies. He recently published The VNA Applications Handbook through Artech House.

Rick Daniel has 30 years of experience in RF and microwave design and measurement with deep expertise in spectrum analysis, network analysis and communications. Prior to joining Rohde & Schwarz, Rick held positions in hardware design / system integration at Texas Instruments and Raytheon, and Application Engineering at HP/Agilent. In addition to an MSEE from SMU he also has a BSEE from Texas Tech University.

Martin Lim is a national application engineer with Rohde & Schwarz. He brings with him 22 years of semiconductor, wireless, and RF test experience. Currently focused on mmWave 5GNR physical layer testing. Past projects include 5GNR mmWave test system development; Envelope tracking; Amplifier (FEMiD) test; 802.11AC MIMO; Test Automation Speed & Radiated 5GNR. Prior to joining R&S, he served as RF Characterization Manager at Nokia Mobile Phones. Martin was responsible for cellular Tx/Rx, GPS, and 802.11 test systems development. He received his B.S. in Electrical Engineering from California Polytechnic, Pomona.

Neil Jarvis is known for his expertise in RF and microwave design, specializing in Vector Network Analysis and Spectrum Analysis. In his more than 22 years of experience in design engineering, test engineering and product development he's held positions with National Semiconductor, Tagent Corporation, Northrop Grumman Corporation, and Agilent Technologies. In addition to his degrees in Math, EE, Technology Management and Systems Analysis, Neil holds multiple patents in RFID technology.